We investigate the systematic errors at the second order for a Mueller matrix ellipsometer in
the dual rotating compensator configuration. Starting from a general formalism, we derive …

The characterization of anisotropic materials and complex systems by ellipsometry has
pushed the design of instruments to require the measurement of the full reflection Mueller …

Noticeable depolarization effects are observed in the measurement of the air using an in-
house developed dual rotating-compensator Mueller matrix ellipsometer. We demonstrate …

A dual rotating compensator ellipsometer based on the optical PC1SC2A configuration
described by Collins [1, chap. 7.3] has been developed. The systematic errors for this …

Dual-rotating compensator Mueller matrix ellipsometer (DRC-MME) has been designed and
applied as a powerful tool for the characterization of thin films and nanostructures. The …

A focusing lens consisting of two or more elements is widely used in ellipsometers for spatial
resolution. In a typical ellipsometer layout, a lens is placed before the sample to focus light …

The linear errors of Mueller matrix measurements are formulated for misalignment,
depolarization, and incorrect retardation of the polarimetric components. The measured …

Abstract The Mueller Matrix Ellipsometer based on the optical PC1SC2A arrangement has
been developped by Collins a few years ago. We present systematic errors due to a shift of …

To reduce the error induced by light source fluctuations, motor rotation instability,
environment, and other factors in real-time measurements using dual-rotating compensator …

In this work, the error sources that affect a dual rotating retarder polarimeter working in a
discrete rotation scheme are studied. Moreover, those errors not sufficiently analyzed in the …