Optimal configuration of partial Mueller matrix polarimeter for measuring the ellipsometric parameters in the presence of Poisson shot noise and Gaussian noise

N Quan, C Zhang, T Mu - Photonics and Nanostructures-Fundamentals and …, 2018 - Elsevier
We address the optimal configuration of a partial Mueller matrix polarimeter used to
determine the ellipsometric parameters in the presence of additive Gaussian noise and …

[HTML][HTML] Error analysis and calibration improvement of the imaging section in a Mueller matrix microscope

J Yu, X Cheng, M Li - Applied Sciences, 2020 - mdpi.com
Currently, there are various calibration methods available to reduce the errors caused by the
polarizing section of a dual-rotating-retarder polarimeter. Although these methods have high …

A single zone azimuth calibration for rotating compensator multichannel ellipsometry

I An, J Lee, KY Bang, OK Kim… - Japanese journal of …, 2003 - iopscience.iop.org
A rotating compensator type spectroscopic ellipsometry (RCSE) equipped with a
multichannel detector was developed. For accurate data reduction, the azimuth of each …

Optimum input states of polarization for Mueller matrix measurement in a system having finite polarization-dependent loss or gain

H Dong, YD Gong, V Paulose, P Shum, M Olivo - Optics Express, 2009 - opg.optica.org
We present the theoretical and simulation results of the relationship between three input
states of polarization (SOP) and the Mueller matrix measurement error in an optical system …

Polarizer calibration method for Mueller matrix polarimeters

R Ossikovski, B Al Bugami, E Garcia-Caurel… - Applied …, 2020 - opg.optica.org
We advance what we believe is a novel eigenvalue-based method for calibrating Mueller
matrix polarimeters employing a single calibration optical component: a polarizer. The …

Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers

DE Aspnes - JOSA A, 2004 - opg.optica.org
I investigate the dependence of shot-noise-limited uncertainties of the ellipsometric
parameters ψ and Δ for the rotating-analyzer ellipsometer (RAE) and the rotating …

Some aspects on the uncertainty calculation in Mueller ellipsometry

M Wurm, T Grunewald, S Teichert, B Bodermann… - Optics express, 2020 - opg.optica.org
In this paper, we focus on the metrological aspects of spectroscopic Mueller ellipsometry—ie
on the uncertainty estimation of the measurement results. With the help of simulated Mueller …

Dual rotating compensator ellipsometry: Theory and simulations

J Li, B Ramanujam, RW Collins - Thin Solid Films, 2011 - Elsevier
Systematic methods for data reduction have been developed for the dual rotating-
compensator ellipsometer in the PC1r (ω1) SC2r (ω2) A configuration, where P, C1r (ω1), S …

Alignment method for rotating analyzer ellipsometry

S Kawabata - JOSA A, 1987 - opg.optica.org
A new method of aligning the optical components has been proposed for the polarizer–
specimen–compensator–analyzer ellipsometer configuration. By carrying out the …

Estimation variance of dual-rotating-retarder Mueller matrix polarimeter in the presence of Gaussian thermal noise and poisson shot noise

N Quan, C Zhang, T Mu, S Li, C You - Journal of Optics, 2019 - iopscience.iop.org
In this paper, the close-form functions of estimation variances on the elements of the
measured Mueller matrix for a dual-rotating-retarder Mueller matrix polarimeter with a …