We describe the design of a high-speed multichannel ellipsometer in the optical
configuration PC_1r (ω_1) SC_2r (ω_2) A having frequency-coupled rotating compensators …

A multichannel ellipsometer in the dual rotating-compensator configuration has been
developed for applications in real time Mueller matrix spectroscopy of anisotropic surfaces …

A multichannel ellipsometer in the dual rotating-compensator configuration has been
designed and constructed for applications in real time Mueller matrix ellipsometry (approx. 2 …

In this work we derive the five patterns of symmetry of a Mueller matrix, a differential Mueller
matrix and a Jones matrix that can appear in ellipsometry measurements. While a general …

A two-modulator generalized ellipsometer is described that is capable of measuring all 16
elements of a sample Mueller matrix with four measurements made at different azimuthal …

Extension of spectroscopic rotating-analyzer ellipsometry with automated compensator
function to generalized ellipsometry (GE) is reported in order to define and determine three …

This is the eighth in the aperiodic series of ellipsometry conferences, and the third devoted
specifically to spectroscopic ellipsometry. I discuss the evolution of the field mainly from a …

The characterization of anisotropic materials and complex systems by ellipsometry has
pushed the design of instruments to require the measurement of the full reflection Mueller …

In a typical reflection ellipsometry experiment, one characterizes the polarization state
change that a polarized light beam undergoes upon reflection from a specular surface. This …

Techniques for the partial or complete determination of the Mueller matrix of elastic light
scattering by a given samples are reviewed. Important developments include several …