The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

E Salvati, T Sui, AJG Lunt, AM Korsunsky - Materials & Design, 2016 - Elsevier
FIB milling using Ga ions is known to be accompanied by implantation, multiplication of
material defects, material property modification (eg amorphisation), inelastic …
被引用次数：73 相关文章

The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

E Salvati, T Sui, AJG Lunt, AM Korsunsky - Materials and Design, 2016 - inis.iaea.org
[en] Highlights:• Implantation of Ga ions during FIB milling leads to the introduction of
inelastic strain that causes apparent surface strain• If milled features become comparable …

The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

E Salvati, T Sui, AJG Lunt, AM Korsunsky - Materials & Design, 2016 - infona.pl
FIB milling using Ga ions is known to be accompanied by implantation, multiplication of
material defects, material property modification (eg amorphisation), inelastic …

The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

E Salvati, T Sui, AJG Lunt… - Materials and …, 2016 - researchportal.bath.ac.uk
FIB milling using Ga ions is known to be accompanied by implantation, multiplication of
material defects, material property modification (eg amorphisation), inelastic …

The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

E Salvati, T Sui, AJG Lunt, AM Korsunsky - MATERIALS & DESIGN, 2016 - air.uniud.it
FIB milling using Ga ions is known to be accompanied by implantation, multiplication of
material defects, material property modification (eg amorphisation), inelastic …

[引用][C] The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

E Salvati, T Sui, AJG Lunt, AM Korsunsky - Materials & Design, 2016 - elibrary.ru
AMK acknowledges funding received for the MBLEM laboratory at Oxford through EU FP7
project iSTRESS (604646), and access to the facilities at the Research Complex at Harwell …
[PDF] core.ac.uk

[PDF][PDF] The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

E Salvati, T Sui, A Lunt, AM Korsunsky - core.ac.uk
FIB milling using Ga ions is known to be accompanied by implantation, multiplication of
material defects, material property modification (eg amorphisation), inelastic …

[引用][C] The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC residual stress evaluation

A Lunt - researchportal.bath.ac.uk
The effect of eigenstrain induced by ion beam damage on the apparent strain relief in FIB-DIC
residual stress evaluation – Profiles — the University of Bath's research portal Skip to main …