Carrier profiling of ZnO nanowire structures by scanning capacitance microscopy and scanning spreading resistance microscopy

L Wang - 2016 - theses.hal.science
Based on atomic force microscope (AFM), scanning capacitance microscopy (SCM) and
scanning spreading resistance microscopy (SSRM) have demonstrated high efficiency for …
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Carrier profiling of ZnO nanowire structures by scanning capacitance microscopy and scanning spreading resistance microscopy

L Wang - 2016 - inria.hal.science
Based on atomic force microscope (AFM), scanning capacitance microscopy (SCM) and
scanning spreading resistance microscopy (SSRM) have demonstrated high efficiency for …

Carrier profiling of ZnO nanowire structures by scanning capacitance microscopy and scanning spreading resistance microscopy

L Wang - 2016 - theses.fr
Ce travail de thèse porte sur l'application des techniques Scanning Capacitance Microscopy
(SCM) et Scanning Spreading Resistance Microscopy (SSRM) pour la caractérisation …

Carrier profiling of ZnO nanowire structures by scanning capacitance microscopy and scanning spreading resistance microscopy

L Wang - 2016 - hal.science
Based on atomic force microscope (AFM), scanning capacitance microscopy (SCM) and
scanning spreading resistance microscopy (SSRM) have demonstrated high efficiency for …