Electrical characterization of semiconductor materials and devices

MJ Deen, F Pascal - Springer Handbook of Electronic and Photonic …, 2017 - Springer
… been the rapid advances made in the quality and processing of materials – semiconductors,
… This chapter is devoted to the electrical characterization of semiconductors, insulators and …

Applications of atomic force microscopy in materials, semiconductors, polymers, and medicine: A minireview

J Chen, K Xu - Instrumentation Science & Technology, 2020 - Taylor & Francis
advanced research results using AFM in the micro-nano science community to operate in the
four main areas of materials, semiconductor … of the electrical properties of semiconductors

Atomic force microscopy: A powerful tool for electrical characterization

R Tararam, PS Garcia, DK Deda, JA Varela… - Nanocharacterization …, 2017 - Elsevier
… In its more than 25-year history, AFM has had its … properties of materials. This chapter will
address the concepts and principles of AFM, as well as various aspects related to electrical

Advances in the Use of Atomic Force Microscopy as a Diagnostic Tool for Solar Cells Characterization: From Material Design to Device Applications

CC Ahia, EL Meyer - physica status solidi (a), 2024 - Wiley Online Library
… precisely utilized in conducting failure analysis of semiconductor devices, and is well …
Apart from its usefulness in characterizing the electrical properties of materials, PC-AFM is a …

[HTML][HTML] Calculating electrostatic interactions in atomic force microscopy with semiconductor samples

J Xu, J Li, W Li - AIP Advances, 2019 - pubs.aip.org
Atomic force microscopy (AFM) and its non-contact electrical modes such as Kelvin probe
… used to characterize the surface electrical properties of metal, dielectric and semiconductor

Hybrid AFM for nanoscale physicochemical characterization: recent development and emerging applications

W Fu, W Zhang - Small, 2017 - Wiley Online Library
electric properties can be mapped and quantified by AFMproperties in different research
fields such as semiconductors, … , recent developments and applications of the AFM-IR and AFM-…

Atomic force microscopy for two-dimensional materials: A tutorial review

H Zhang, J Huang, Y Wang, R Liu, X Huai, J Jiang… - Optics …, 2018 - Elsevier
… Beyond topography and local force control, advanced AFM modes … Uncovering electric
properties such as conductivity, surface … Electrical AFM is well-suited for acquiring these types of …

Nanoscaled Electrical Characterization

U Celano, U Celano - Metrology and Physical Mechanisms in New …, 2016 - Springer
… Thanks to the major advance of semiconductor fabrication processes, AFM tips are generally
manufactured starting from silicon. Alternatively silicon nitride is used for the tip body, the …

Recent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniques

S Handschuh-Wang, T Wang, X Zhou - RSC advances, 2017 - pubs.rsc.org
… relying on AFM, while … AFM and complementary techniques. The main focus of these hybrid
techniques is on the combination with optical techniques as there has been much progress

Atomic force microscopy-Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles …

X Shi, W Qing, T Marhaba, W Zhang - Electrochimica Acta, 2020 - Elsevier
… Afterwards, significant advancements have been achieved in the fields of combined AFM-…
electrical properties such as conductivity. Mostly used on conductive or dielectric materials …