… of InP nanowires containing ap–n junction using scanning … from our KPFM image is that the
depletion region and dopant … across ap–n junction under each bias condition is illustrated by …

… Secondary electron and electron beam-induced current images obtained using scanning …
electrons (holes) depleting n-type (p-type) segments. This depletion region in our case might …

… /InP junction at 5 K for zero bias. … depletion of free holes in the InP side of the heterojunction
leads to the formation a space charge region, which can be modeled by a tunneling junction. …

… transport is implemented within the depletion region that mostly … the SCM tip scans from n-
to p-type doped area. Practically, … sample B even at very low bias voltage, which indicates that …

… Scanning electron microscopy has been successfully used to … the depletion width are
modified in the presence of a bias … across the pn junction map therefore provides a direct trace of …

… The determination of junction depletion width is crucial for the … The polymer analogue of a
conventional pn or pin junction can … -junction LECs, as directly measured using secondary ion …

… step across the pn junction, the built-in potential of the pn junction was … pn junction had a
depletion layer with a width of 24 ± 1 nm; the width increased to 26 ± 1 nm under a reverse bias …

… prior to the p–n junction within the n-type depletion region before … microscopy using scanning
electron microscopy. The … in the selected-area aperture (SAD) holder biased to a potential …

… conditions during EBIC scans. EBIC characterization was … for positive bias in order to
map out the NDR region correctly. … , we can confirm a wider depletion region for the non-working …

… can be mapped directly and compared to high resolution images. … and welded to the electrical
biasing chip. The specimen is … the edge of the depletion region, which is best seen using a …