… -focused ion beam (FIB) milling from a bulk sample. During the FIB process, the choice of the
pillar shape and the energy of the Ga ions can significantly impact the … of micropillars in the …

… The decreasing size dependence in BCC micropillars is due to the restricted mobility of the
… previous micromechanical testing is the surface damage from focused ion beam (FIB) milling. …

… [1–4] HIM has several advantages, when compared with the widely used gallium ion microscope
(often cited as focused ion beam, FIB) for the fabrication and examination of micropillars…

… of the fabricated micro-pillars. By utilizing a Ga … damage caused during the Focused Ion
Beam (FIB) milling procedure, a concluding polishing step utilizing a 2 keV gallium ion beam …

… energy dispersive x-ray spectroscopy EDX energy dispersive x-ray FCC face-centred cubic
… focused ion beam GLAD glancing angle deposition HCP hexagonal closed packed IMP …

… -pillars of different sizes were milled by focused ion beam (FIB) and tested by … damage. All
these aspects could be studied thanks to the considerable increase in strength of micropillars …

… concerning the effect of FIB-induced damage on the apparent … It worth noting that miniaturised
components such micro-pillars … Once the eigenstrain induced by Focused Ion Beam was …

… focused ion beam (FIB) plasticity has been observed. However, typical drawbacks of this
methodology are FIB-damage … number of <100>-oriented Si pillars with various diameters in the …

… micro-pillars by using a focused ion beam (FIB) technique. The BCC phase produced by the
FIB damage … scan of the surface with the Ga + ion beam. Use of a low acceleration voltage …

… testing is the effect of surface damage from focused ion beam (FIB) … beam diffraction conditions
in the small volumes of the 0.5 μm pillars, because the region of interest in the micropillar …