… gold plating conditions finally enabled sub-100nm structures which show promising optical
… b) These produce an amplification of the surface undulation at the characteristic wavelength …

… However, the degraded mechanical and chemical robustness of the low-k dielectrics are …
In the sub-100nm regime, the agreement of our results with the Cu/Ta(9nm) bilayer result is …

… However, for the analysis of a bilayer structure with mask and masked layers, the mask layer
includes the … Undulation of sub- 100nm porous dielectric structures: a mechanical analysis …

… Since the dielectric function of TiN exhibits thickness dependence, we had to take this fact …
Moreover, presence of the highly absorbing films influences extracted thicknesses of dielectric …

… to analyze the film thickness. The stack structure of the aC film on the Si substrate was
analyzed using a model based on the Tanguy formulation [38], [39], [40] to represent the dielectric …

… A small sphere with a complex dielectric constant ε(ν) in a surrounding medium of
dielectric constant ε0 is used to represent the metallic nano-structure. The …

… The resonator characteristic impedance Ztml and effective permittivity ϵeff are the two main
properties of the TL that can be adjusted by controlling the trace width s and ground spacing …

… Stepwise increase in current from 0 to 50 pA reflects the incorporation of a single pore.
This image was reprinted under the creative commons license found at: https://creativecommons.…