[HTML][HTML] Deformation behavior of aluminum pillars produced by Xe and Ga focused ion beams: Insights from strain rate jump tests

Materials & Design, 2019 - Elsevier
Micro-compression testing of focused ion beam fabricated pillars is a popular technique for
mechanical characterization at small scales. However, there are concerns associated with …

Deformation behavior of aluminum pillars produced by Xe and Ga focused ion beams: Insights from strain rate jump tests

Y Xiao, V Maier-Kiener, J Michler… - Materials and …, 2019 - pure.unileoben.ac.at
Micro-compression testing of focused ion beam fabricated pillars is a popular technique for
mechanical characterization at small scales. However, there are concerns associated with …

[PDF][PDF] Deformation behavior of aluminum pillars produced by Xe and Ga focused ion beams: Insights from strain rate jump tests

Y Xiao, V Maier-Kiener, J Michler, R Spolenak… - Materials and …, 2019 - researchgate.net
Focused ion beam (FIB) machining has enabled a large variety of test geometries for
micromechanical testing on small scales, allowing investigations of stress-strain behavior as …

Deformation behavior of aluminum pillars produced by Xe and Ga focused ion beams: Insights from strain rate jump tests

Y Xiao, V Maier-Kiener, J Michler… - Materials & …, 2019 - research-collection.ethz.ch
Micro-compression testing of focused ion beam fabricated pillars is a popular technique for
mechanical characterization at small scales. However, there are concerns associated with …

[PDF][PDF] Deformation behavior of aluminum pillars produced by Xe and Ga focused ion beams: Insights from strain rate jump tests

Y Xiao, V Maier-Kiener, J Michler, R Spolenak… - Materials and …, 2019 - dora.lib4ri.ch
Focused ion beam (FIB) machining has enabled a large variety of test geometries for
micromechanical testing on small scales, allowing investigations of stress-strain behavior as …

[PDF][PDF] Deformation behavior of aluminum pillars produced by Xe and Ga focused ion beams: Insights from strain rate jump tests

Y Xiao, V Maier-Kiener, J Michler, R Spolenak… - Materials and …, 2019 - dora.lib4ri.ch
Focused ion beam (FIB) machining has enabled a large variety of test geometries for
micromechanical testing on small scales, allowing investigations of stress-strain behavior as …