… induced by indentation complicates comparisons with traditional uniaxial measurements of
yield behavior. In this work, we apply a focused ion beam (… Micropillar compression has been …

… The micropillars were milled by a focused ion beam (FIB) in an FE-SEM (MIRA 1 LHM,
TESCAN) using a 30 keV Ga ion beam (beam … The compressive properties of micropillars were …

… focused ion beam (FIB). These 31 rough machined pillars were selected to probe orientation
effects … 800 eV 100 pA to minimize FIB-induced damage. Annular dark field (ADF) scanning (…

… effects occur when compared to results obtained near the surface. By compressing in-situ
Fe… irradiated single crystalline micropillars in a SEM, we want to assess the irradiation effect on …

… beam scanning electron microscope and focused ion beam (FIB-SEM Dual-Beam) was used
to fabricate micro-pillars … size effects in unirradiated and irradiated 800H micro-pillars from …

… were conducted on micropillars, with … size effect as well as the strain-rate-sensitivity of the
nanocrystalline Ta samples, small compression pillars were machined via focused ion beam (…

… irradiation-induced defects. The focused ion beam technique (FIB) was utilized to prepare
both cross-sectional TEM specimens and micropillars designated for micropillar compression …

… In this work, the focus ion beam (FIB) technique was employed to fabricate AlON … >-oriented
AlON pillars In order to reveal the underlying deformation mechanism of AlON micropillars …

… In-Situ Irradiation Induced Creep The stress states of micro-pillars uniaxial creep tests
are similar to those of conventional creep tests, making it more reliable to assess the creep …

… dislocation distribution in deformed single crystal copper micropillars. Identical micropillars
(6 μm × 6 μm × 18 μm in size) were fabricated by focused ion beam (FIB) and compressed at …