The development of xenon plasma focused ion-beam (Xe+ PFIB) milling technique enables
site-specific sample preparation with milling rates several times larger than the conventional …

This article considers the fundamentals of what happens in a solid when it is impacted by a
medium-energy gallium ion. The study of the ion/sample interaction at the nanometer scale …

Abstract Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By
manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt …

Focused ion beams (FIBs) are versatile tools with cross-disciplinary applications from the
physical and life sciences to archeology. Nevertheless, the nanoscale patterning precision …

Focused ion beam (FIB) microscopy uses Ga+ ions to remove material from a sample for a
variety of imaging and preparation techniques. While considerable work has examined the …

Focused ion beam (FIB) milling is an increasingly popular technique for fabricating micro-
sized samples for nanomechanical characterization. Previous investigations have cautioned …

This study presents a detailed examination of the lattice distortions introduced by glancing
incidence Focussed Ion Beam (FIB) milling. Using non-destructive multi-reflection Bragg …

Recently, the dual beam Xe+ plasma focused ion beam (Xe+ pFIB) instrument has attracted
increasing interest for site‐specific transmission electron microscopy (TEM) sample …

The frontier of today's scientific and engineering research is undoubtedly in the realm of
nanotechnology: The imaging, manipulation, fabrication, and application of systems at the …

A simulation study of focused ion beam (FIB) sputtering in SiO 2 is presented. The basis of
this study is an enhanced version of the EnvizION Monte Carlo simulation program for FIB …