Applications of atomic force microscopy in materials, semiconductors, polymers, and medicine: A minireview

J Chen, K Xu - Instrumentation Science & Technology, 2020 - Taylor & Francis
advanced research results using AFM in the micro-nano science community to operate in the
four main areas of materials, semiconductor … of the electrical properties of semiconductors

Atomic force microscopy-Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles …

X Shi, W Qing, T Marhaba, W Zhang - Electrochimica Acta, 2020 - Elsevier
… Afterwards, significant advancements have been achieved in the fields of combined AFM-…
electrical properties such as conductivity. Mostly used on conductive or dielectric materials …

[HTML][HTML] Conductive atomic force microscopy of semiconducting transition metal dichalcogenides and heterostructures

F Giannazzo, E Schilirò, G Greco, F Roccaforte - Nanomaterials, 2020 - mdpi.com
AFM has been recently employed as a powerful tool for direct probing of the electrical properties
… is still in its infancy, and further developments of this approach will be required to realize …

Atomic force microscopy for nanoscale mechanical property characterization

G Stan, SW King - Journal of Vacuum Science & Technology B, 2020 - pubs.aip.org
… range of materials including ceramics, metals, semiconductors, polymers, and biomaterials.
In the … In line with these developments, a major highlight of this review is the discussion of the …

Emerging conductive atomic force microscopy for metal halide perovskite materials and solar cells

H Si, S Zhang, S Ma, Z Xiong, A Kausar… - Advanced Energy …, 2020 - Wiley Online Library
… -AFM with a set of current amplifiers attached to the microscope can be devoted to imagining
the morphology and characterizing local electrical properties of … as metal, semiconductor, or …

Applications of AFM in Membrane Characterization and Fouling Analysis

Q Liu, X Zhu, B Chen, X Zhu - ACS ES&T Engineering, 2024 - ACS Publications
… the application progress of AFM in the surface characterizationcharacterization of electrical
properties through Electrical … for two-dimensional carrier analysis in semiconductor scanning …

[HTML][HTML] Atomic force microscopy: Emerging illuminated and operando techniques for solar fuel research

W Yu, HJ Fu, T Mueller, BS Brunschwig… - The Journal of Chemical …, 2020 - pubs.aip.org
… We review recent progress in AFM for (1) steady-state and … additional mechanical and
electrical properties at the nanometer-… changes and electrical/potential signals of semiconductors/…

[HTML][HTML] Recent applications of advanced atomic force microscopy in polymer science: A review

P Nguyen-Tri, P Ghassemi, P Carriere, S Nanda… - Polymers, 2020 - mdpi.com
progress in the application of AFM and AFM-IR in polymer science. We describe the principle
of AFM-… be promising for characterizing 1D and 2D nanomaterials, semiconductors, organic …

AFM-IR and IR-SNOM for the characterization of small molecule organic semiconductors

VJ Rao, M Matthiesen, KP Goetz, C Huck… - The Journal of …, 2020 - ACS Publications
… these two advanced IR microscopy … semiconductors. Single crystals are generally regarded
as ideal model systems to investigate the fundamental properties of organic semiconductors. …

Electrical characterization of individual cesium lead halide perovskite nanowires using conductive AFM

A Stern, S Aharon, T Binyamin, A Karmi… - Advanced …, 2020 - Wiley Online Library
… Illustration of the actual bias on semiconducting structure upon application of bias … atomic
force microscopy (AFM) measurements on single cesium lead halide nanowires in high electric