X Shi, W Qing, T Marhaba, W Zhang - Electrochimica Acta, 2020 - Elsevier
… Afterwards, significant advancements have been achieved in the fields of combined AFM-… electricalproperties such as conductivity. Mostly used on conductive or dielectric materials …
… AFM has been recently employed as a powerful tool for direct probing of the electricalproperties … is still in its infancy, and further developments of this approach will be required to realize …
G Stan, SW King - Journal of Vacuum Science & Technology B, 2020 - pubs.aip.org
… range of materials including ceramics, metals, semiconductors, polymers, and biomaterials. In the … In line with these developments, a major highlight of this review is the discussion of the …
H Si, S Zhang, S Ma, Z Xiong, A Kausar… - Advanced Energy …, 2020 - Wiley Online Library
… -AFM with a set of current amplifiers attached to the microscope can be devoted to imagining the morphology and characterizing local electricalproperties of … as metal, semiconductor, or …
Q Liu, X Zhu, B Chen, X Zhu - ACS ES&T Engineering, 2024 - ACS Publications
… the application progress of AFM in the surface characterization … characterization of electrical properties through Electrical … for two-dimensional carrier analysis in semiconductor scanning …
… We review recent progress in AFM for (1) steady-state and … additional mechanical and electricalproperties at the nanometer-… changes and electrical/potential signals of semiconductors/…
… progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-… be promising for characterizing 1D and 2D nanomaterials, semiconductors, organic …
VJ Rao, M Matthiesen, KP Goetz, C Huck… - The Journal of …, 2020 - ACS Publications
… these two advanced IR microscopy … semiconductors. Single crystals are generally regarded as ideal model systems to investigate the fundamental properties of organic semiconductors. …
A Stern, S Aharon, T Binyamin, A Karmi… - Advanced …, 2020 - Wiley Online Library
… Illustration of the actual bias on semiconducting structure upon application of bias … atomic forcemicroscopy (AFM) measurements on single cesium lead halide nanowires in high electric …