… /InP junction at 5 K for zero bias. … depletion of free holes in the InP side of the heterojunction
leads to the formation a space charge region, which can be modeled by a tunneling junction. …

… can be mapped directly and compared to high resolution images. … and welded to the electrical
biasing chip. The specimen is … the edge of the depletion region, which is best seen using a …

… through in situ biased four-dimensional scanning transmission electron microscopy (4D-STEM).
Measurements of electric field, built-in voltage, depletion region width, … pixelated direct …

… scanning electron microscope image of the bare InP … overall low leakage current under
reverse bias also indicates the … a trade-off between depletion region width and device speed. As …

… P 2 -source diffusion process and the guard rings were directly characterized by the scanning
… the electric field in the multiplication region under small bias and it can make the electric …

… demonstrated direct imaging of confined carriers in the III-N … probe (ground) scans over
the DC biased sample surface. … The depletion region or space charge region (SCR) is mainly …

… under the light of a wavelength of 808 nm and a reverse bias … , the scanning electron
microscope (SEM) image was used to … are blocked by Al 2 O 3 accumulate in the depletion region. …

… –f shows scanning electron microscopy (SEM) images of the … lead to the presence of depletion
regions at the surfaces of … the p–n junction as a function of applied forward bias voltage. …

… junction with different bias applied. For the depletion width we discuss both total and full
width … a peak appears while the probe scans the depletion region. As the convergence angle …

… pixels and are captured by the depletion region. However, the … p of the CES remain consistent
when the SPAD reverse bias … contour from scanning electron microscope (SEM) images (…