… -focused ion beam (FIB) milling from a bulk sample. During the FIB process, the choice of the
pillar shape and the energy of the Ga ions can significantly impact the … of micropillars in the …

… of the fabricated micro-pillars. By utilizing a Ga … damage caused during the Focused Ion
Beam (FIB) milling procedure, a concluding polishing step utilizing a 2 keV gallium ion beam …

… focused ion beam (FIB) plasticity has been observed. However, typical drawbacks of this
methodology are FIB-damage … number of <100>-oriented Si pillars with various diameters in the …

… testing is the effect of surface damage from focused ion beam (FIB) … beam diffraction conditions
in the small volumes of the 0.5 μm pillars, because the region of interest in the micropillar …

… A focused ion beam (FIB) mill with 30 keV Ga + ions was used to etch the micropillar … current
of 50 pA and a voltage of 5 keV, in which FIB-induced damage is minimized. An FEI Tecnai …

… The development of xenon plasma focused ion-beam (Xe + PFIB) milling … focused ion-beam
(Ga + FIB) technique. As such, the effect of higher beam currents and the heavier ions …

… micro-pillars by using a focused ion beam (FIB) technique. The BCC phase produced by the
FIB damage … scan of the surface with the Ga + ion beam. Use of a low acceleration voltage …

… The fabrication routes studied in this thesis project use the combination of the fs-laser and
plasma focused ion beam (PFIB) to machine the micro-tensile specimens. (100) single crystal …

… between focused ion beam-manufactured [1 1 1]- and [0 0 1]-oriented austenite micro-pillars …
After yielding, the strain hardening of two orientation micro-pillars increased sharply as a …

… The micropillars were fabricated using a focused ion beam (FIB) device FB-2100 (Hitachi).
The top square surface of micropillars … F82H to investigate the size effect. Twelve pillars were …