Altering a pseudo-random bit sequence for scan-based BIST

Proceedings International Test Conference 1996. Test …, 1996 - ieeexplore.ieee.org
This paper presents a low-overhead scheme for the built-in self-test (BIST) of circuits with
scan. Complete (100%) fault coverage is obtained without modifying the function logic and …
被引用次数：267 相关文章
[PDF] researchgate.net

[PDF][PDF] ALTERING A PSEUDO-RANDOM BIT SEQUENCE FOR SCAN-BASED BIST

NA Touba, EJ McCluskey - researchgate.net
This paper presents a low-overhead scheme for built-in self-test of circuits with scan.
Complete (100%) fault coverage is obtained without modifying the function logic and without …
[PDF] psu.edu

[PDF][PDF] ALTERING A PSEUDO-RANDOM BIT SEQUENCE FOR SCAN-BASED BIST

NA Touba, EJ McCluskey - Citeseer
This paper presents a low-overhead scheme for built-in self-test of circuits with scan.
Complete (100%) fault coverage is obtained without modifying the function logic and without …

[引用][C] Altering a pseudo-random BIT sequence for scan-based BIST

NA TOUBA - Proc. ITC, 1996, 1996 - cir.nii.ac.jp

Altering A Pseudo-Random Bit Sequence For Scan-Based BIST

NA Touba, EJ McCluskey - … Test Conference 1996. Test and Design …, 1996 - computer.org
This paper presents a low-overhead scheme for built-in self-test of circuits with scan.
Complete (100%) fault coverage is obtained without modifying the function logic and without …

[引用][C] Altering a Pseudo-Random Bit Sequence for Scan-Based BIST

NA Touba, EJ McCluskey - Proceedings of the IEEE International Test …, 1996 - dl.acm.org
Altering a Pseudo-Random Bit Sequence for Scan-Based BIST | Proceedings of the IEEE
International Test Conference on Test and Design Validity skip to main content ACM Digital …
[PDF] archive.org

[PDF][PDF] ALTERING A PSEUDO-RANDOM BIT SEQUENCE FOR SCAN-BASED BIST

NA Touba, EJ McCluskey - scholar.archive.org
This paper presents a low-overhead scheme for built-in self-test of circuits with scan.
Complete (100%) fault coverage is obtained without modifying the function logic and without …

[引用][C] Altering a pseudo-random BIT sequence for scan-based BIST

NA TOUBA - Proc. ITC, 1996, 1996 - cir.nii.ac.jp
Altering a pseudo-random BIT sequence for scan-based BIST | CiNii Research CiNii 国立
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