Built-in self-test structures

EJ McCluskey - IEEE Design & Test of Computers, 1985 - ieeexplore.ieee.org
A system that includes self-test features must have facilities for generating test patterns and
analyzing the resultant circuit response. This article surveys the structures that are used to …
被引用次数：118 相关文章

Built-In Self-Test Structures

E McCluskey - IEEE Design & Test of Computers, 1985 - computer.org
A system that includes self-test features must have facilities for generating test patterns and
analyzing the resultant circuitresponse. This article surveys the structures that are used to …

Built-In Self-Test Structures

E McCluskey - IEEE Design & Test of Computers, 1985 - infona.pl
A system that includes self-test features must have facilities for generating test patterns and
analyzing the resultant circuit response. This article surveys the structures that are used to …

Built-In Self-Test Structures

E McCluskey - IEEE Design & Test, 1985 - dl.acm.org
A system that includes self-test features must have facilities for generating test patterns and
analyzing the resultant circuitresponse. This article surveys the structures that are used to …