M Roca, A Rubio - Electronics Letters, 1992 - infona.pl
The testability of failures modelled by bridges and stuck-open faults in CMOS current mode based operational amplifiers is investigated. The functional and I/sub DD/current effects …
M Roca, A Rubio - Electronics Letters, 1992 - ieeexplore.ieee.org
The testability of failures modelled by bridges and stuck-open faults in CMOS current mode based operational amplifiers is investigated. The functional and I/sub DD/current effects …
The testability of failures modelled by bridges and stuck-open faults in CMOS current mode based operational amplifiers is investigated. The functional and IDD current effects caused …