Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
R Claveau, M Flury, W Uhring… - … , range imaging, and …, 2015 - spiedigitallibrary.org
Transparent layers such as polymers are complex and can contain defects which are not
detectable with classical optical inspection techniques. With an interference microscope …
detectable with classical optical inspection techniques. With an interference microscope …
[引用][C] Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A Leong-Hoï, R Claveau, M Flury, W Uhring… - Proceedings of SPIE …, 2015 - hal.science
Detection of defects in a transparent polymer with high resolution tomography using white
light scanning interferometry and noise reduction - Archive ouverte HAL Accéder directement …
light scanning interferometry and noise reduction - Archive ouverte HAL Accéder directement …
Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A Leong-Hoï, R Claveau, M Flury… - Videometrics …, 2015 - ui.adsabs.harvard.edu
Transparent layers such as polymers are complex and can contain defects which are not
detectable with classical optical inspection techniques. With an interference microscope …
detectable with classical optical inspection techniques. With an interference microscope …
Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A Leong-Hoi, R Claveau, M Flury, W Uhring… - Proceedings of …, 2015 - hero.epa.gov
Transparent layers such as polymers are complex and can contain defects which are not
detectable with classical optical inspection techniques. With an interference microscope …
detectable with classical optical inspection techniques. With an interference microscope …
[引用][C] Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A Leong-Hoï, R Claveau, M Flury… - Proceedings of SPIE …, 2015 - hal.parisnanterre.fr
Detection of defects in a transparent polymer with high resolution tomography using white light
scanning interferometry and noise reduction - Université Paris Nanterre Accéder directement au …
scanning interferometry and noise reduction - Université Paris Nanterre Accéder directement au …
[PDF][PDF] Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A Leong-Hoïa, R Claveaua, M Flurya, W Uhringa… - Proc. of SPIE Vol - researchgate.net
Transparent layers such as polymers are complex and can contain defects which are not
detectable with classical optical inspection techniques. With an interference microscope …
detectable with classical optical inspection techniques. With an interference microscope …
[PDF][PDF] Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A Leong-Hoïa, R Claveaua, M Flurya, W Uhringa… - Proc. of SPIE … - publis.icube.unistra.fr
Transparent layers such as polymers are complex and can contain defects which are not
detectable with classical optical inspection techniques. With an interference microscope …
detectable with classical optical inspection techniques. With an interference microscope …
[PDF][PDF] Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction
A Leong-Hoïa, R Claveaua, M Flurya, W Uhringa… - Proc. of SPIE … - publis.icube.unistra.fr
Transparent layers such as polymers are complex and can contain defects which are not
detectable with classical optical inspection techniques. With an interference microscope …
detectable with classical optical inspection techniques. With an interference microscope …