Photorefractive imaging of semiconductor wafers

RB Bylsma, DH Olson, AM Glass - Applied physics letters, 1988 - pubs.aip.org
Making use of the photorefractive effect, we have developed a versatile method of imaging
various crystal properties of semi‐insulating compound semiconductors. The magnitude and …
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[引用][C] Photorefractive imaging of semiconductor wafers

RB BYLSMA, DH OLSON, AM GLASS - Applied physics letters, 1988 - pascal-francis.inist.fr
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Photorefractive imaging of semiconductor wafers

RB Bylsma, DH Olson, AM Glass - Applied Physics Letters, 1988 - ui.adsabs.harvard.edu
Making use of the photorefractive effect, we have developed a versatile method of imaging
various crystal properties of semi-insulating compound semiconductors. The magnitude and …

Photorefractive imaging of semiconductor wafers

RB Bylsma - pubs.aip.org
Making use of the photorefractive effect, we have developed a versatile method of imaging
various crystal properties of semi-insulating compound semiconductors. The magnitude and …

Photorefractive imaging of semiconductor wafers

RB Bylsma, DH Olson, AM Glass - Applied Physics Letters, 1988 - aip.scitation.org
Making use of the photorefractive effect, we have developed a versatile method of imaging
various crystal properties of semi‐insulating compound semiconductors. The magnitude and …

[引用][C] Photorefractive imaging of semiconductor wafers

RB BYLSMA, DH OLSON… - Applied physics …, 1988 - American Institute of Physics