Nickel-based Schottky contacts to n-6H-SiC, subjected to various heat treatments, have
been studied by the capacitancevoltage technique, X-ray diffractometry and AES sputter …

Nickel-based Schottky contacts to n-6H-SiC, subjected to various heat treatments, have
been studied by the capacitance-voltage technique, X-ray diffractometry and AES sputter …

The authors wish to thank Dr. AM Strel'chuk for setting up the problem of investigation of
Ni/M-6H-SiC Schottky diodes. The work was supported in part by Arizona University.

The influence of temperature treatment on the formation of Ni-based Schottky diodes and
ohmic contacts to n-6H-SiC | CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ …

Nickel-based Schottky contacts to n-6H-Sic, subjected to various heat treatments, have been
studied by the capacitancevoltage technique, X-ray diffractometry and AES sputter depth …