Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology, 2012 - iopscience.iop.org
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology, 2012 - ui.adsabs.harvard.edu
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy
JP Killgore, DC Hurley - 2012 - nist.gov
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the hundreds of …
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the hundreds of …
[PDF][PDF] Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology, 2012 - researchgate.net
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
[PDF][PDF] Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology, 2012 - scholar.archive.org
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology (Print), 2012 - osti.gov
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology (Print), 2012 - inis.iaea.org
[en] Atomic force microscopy (AFM) methods for quantitative measurements of elastic
modulus on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range …
modulus on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range …
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy.
JP Killgore, DC Hurley - Nanotechnology, 2012 - europepmc.org
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology, 2012 - pubmed.ncbi.nlm.nih.gov
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip-sample contact forces in the range from …
[PDF][PDF] Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy
JP Killgore, DC Hurley - Nanotechnology, 2012 - tsapps.nist.gov
Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …
on stiff (> 10 GPa) materials typically require tip–sample contact forces in the range from …