S Kalinin, A Gruverman - (No Title) - cir.nii.ac.jp
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale | CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ …
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two …