[图书][B] A designer's guide to built-in self-test
CE Stroud - 2005 - books.google.com
A recent technological advance is the art of designing circuits to test themselves, referred to
as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to …
as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to …
A Designer's Guide to Built-In Self-Test
CE Stroud - Springer
A recent technological advance is the art of designing circuits to test themselves, referred to
as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to …
as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to …
[引用][C] A designer's guide to built-in self-test
CE Stroud - (No Title) - cir.nii.ac.jp
A designer's guide to built-in self-test | CiNii Research CiNii 国立情報学研究所 学術情報
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ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データをさがす 大学図書館の本をさがす …
[图书][B] A Designer's Guide to Built-In Self-Test
CE Stroud - 2005 - books.google.com
A recent technological advance is the art of designing circuits to test themselves, referred to
as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to …
as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to …