Low-power testing for low-power devices

X Wen - 2010 IEEE 25th International Symposium on Defect …, 2010 - ieeexplore.ieee.org
Low-power devices are indispensable for modern electronic applications, and numerous
hardware/software techniques have been developed for drastically reducing functional …
被引用次数：4 相关文章

Low-Power Testing for Low-Power Devices

X Wen - Proceedings of the 2010 IEEE 25th International …, 2010 - dl.acm.org
Low-power devices are indispensable for modern electronic applications, and numerous
hardware/software techniques have been developed for drastically reducing functional …

Low-Power Testing for Low-Power Devices

X Wen - 2010 IEEE 25th International Symposium on Defect …, 2010 - computer.org
Low-power devices are indispensable for modern electronic applications, and numerous
hardware/software techniques have been developed for drastically reducing functional …

Low-Power Testing for Low-Power Devices

X Wen - 2010 IEEE 25th International Symposium on Defect … - infona.pl
Low-power devices are indispensable for modern electronic applications, and numerous
hardware/software techniques have been developed for drastically reducing functional …