Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers

H Frentrup, MS Allen - Nanotechnology, 2011 - iopscience.iop.org
Many common atomic force microscope (AFM) spring constant calibration methods regard
the AFM probe as a uniform cantilever, neglecting the tip mass and any nonuniformity in the …
被引用次数：21 相关文章

Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers.

H Frentrup, MS Allen - Nanotechnology, 2011 - europepmc.org
Many common atomic force microscope (AFM) spring constant calibration methods regard
the AFM probe as a uniform cantilever, neglecting the tip mass and any nonuniformity in the …

Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers

H Frentrup, MS Allen - Nanotechnology (Print), 2011 - inis.iaea.org
[en] Many common atomic force microscope (AFM) spring constant calibration methods
regard the AFM probe as a uniform cantilever, neglecting the tip mass and any nonuniformity …

Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers

H Frentrup, MS Allen - Nanotechnology, 2011 - ui.adsabs.harvard.edu
Many common atomic force microscope (AFM) spring constant calibration methods regard
the AFM probe as a uniform cantilever, neglecting the tip mass and any nonuniformity in the …

Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers

H Frentrup, MS Allen - Nanotechnology, 2011 - pubmed.ncbi.nlm.nih.gov
Many common atomic force microscope (AFM) spring constant calibration methods regard
the AFM probe as a uniform cantilever, neglecting the tip mass and any nonuniformity in the …

Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers

H Frentrup, MS Allen - Nanotechnology (Print), 2011 - osti.gov
Many common atomic force microscope (AFM) spring constant calibration methods regard
the AFM probe as a uniform cantilever, neglecting the tip mass and any nonuniformity in the …

[引用][C] Error in dynamic spring constant calibration of atomic force microscope probes due to nonuniform cantilevers

H FRENTRUP, MS ALLEN - Nanotechnology, 2011 - Institute of Physics