A low power deterministic test using scan chain disable technique
Z You, T Iwagaki, M Inoue… - IEICE TRANSACTIONS on …, 2006 - search.ieice.org
This paper proposes a low power scan test scheme and formulates a problem based on this
scheme. In this scheme the flip-flops are grouped into N scan chains. At any time, only one …
scheme. In this scheme the flip-flops are grouped into N scan chains. At any time, only one …
[引用][C] A Low Power Deterministic Test Using Scan Chain Disable Technique
Z YOU, T IWAGAKI, M INOUE… - IEICE Transactions on …, 2006 - journals.flvc.org
A Low Power Deterministic Test Using Scan Chain Disable Technique | IEICE Transactions on
Information and Systems Skip to main content Skip to main navigation menu Skip to site footer …
Information and Systems Skip to main content Skip to main navigation menu Skip to site footer …
[引用][C] A Low Power Deterministic Test Using Scan Chain Disable Technique
Z YOU - IEICE Transactions on Information and Systems, 2006 - ui.adsabs.harvard.edu
A Low Power Deterministic Test Using Scan Chain Disable Technique - NASA/ADS Now on
home page ads icon ads Enable full ADS view NASA/ADS A Low Power Deterministic Test …
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[引用][C] A low power deterministic test using scan chain disable technique
Z YOU, T IWAGAKI, M INOUE… - IEICE transactions on …, 2006 - pascal-francis.inist.fr
A low power deterministic test using scan chain disable technique CNRS Inist Pascal-Francis
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search by …
CNRS Pascal and Francis Bibliographic Databases Simple search Advanced search Search by …
[PDF][PDF] A Low Power Deterministic Test Using Scan Chain Disable
Z YOU, T IWAGAKI, M INOUE, H FUJIWARA - 2006 - researchgate.net
This paper proposes a low power scan test scheme and formulates a problem based on this
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
A Low Power Deterministic Test Using Scan Chain Disable Technique
Z YOU, T IWAGAKI, M INOUE… - IEICE Transactions on …, 2006 - elibrary.ru
This paper proposes a low power scan test scheme and formulates a problem based on this
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
[PDF][PDF] A Low Power Deterministic Test Using Scan Chain Disable
Z YOU, T IWAGAKI, M INOUE, H FUJIWARA - 2006 - core.ac.uk
This paper proposes a low power scan test scheme and formulates a problem based on this
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
A Low Power Deterministic Test Using Scan Chain Disable Technique
Z YOU, T IWAGAKI, M INOUE… - IEICE TRANSACTIONS on …, 2006 - cir.nii.ac.jp
抄録 This paper proposes a low power scan test scheme and formulates a problem based
on this scheme. In this scheme the flip-flops are grouped into N scan chains. At any time …
on this scheme. In this scheme the flip-flops are grouped into N scan chains. At any time …
[PDF][PDF] A Low Power Deterministic Test Using Scan Chain Disable
Z YOU, T IWAGAKI, M INOUE, H FUJIWARA - 2006 - scholar.archive.org
This paper proposes a low power scan test scheme and formulates a problem based on this
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
scheme. In this scheme the flip–flops are grouped into N scan chains. At any time, only one …
A Low Power Deterministic Test Using Scan Chain Disable Technique
Z You, T Iwagaki, M Inoue, H Fujiwara - IEICE-Transactions on …, 2006 - dl.acm.org
This paper proposes a low power scan test scheme and formulates a problem based on this
scheme. In this scheme the flip--flops are grouped into N scan chains. At any time, only one …
scheme. In this scheme the flip--flops are grouped into N scan chains. At any time, only one …