[图书][B] The atomic force microscopy for nanoelectronics

U Celano - 2019 - Springer
The invention of scanning tunneling microscopy (STM), rapidly followed by atomic force
microscopy (AFM), occurred at the time when extensive research on sub-µm metal oxide …
被引用次数：44 相关文章

The Atomic Force Microscopy for Nanoelectronics

U Celano - Electrical Atomic Force Microscopy for Nanoelectronics, 2019 - Springer
The invention of scanning tunneling microscopy (STM), rapidly followed by atomic force
microscopy (AFM), occurred at the time when extensive research on sub-μm metal oxide …
[PDF] unl.edu

[PDF][PDF] Electrical Atomic Force Microscopy for Nanoelectronics

U Celano - unlcms.unl.edu
While piezoelectric and ferroelectric materials started as laboratory rareness materials,
during the 20th century their applications expanded from laboratory to industry and common …

[引用][C] The Atomic Force Microscopy for Nanoelectronics

U Celano - 2019 - imec-publications.be
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Electrical Atomic Force Microscopy for Nanoelectronics

U Celano - Electrical Atomic Force Microscopy for …, 2019 - ui.adsabs.harvard.edu
The tremendous impact of electronic devices on our lives is the result of continuous
improvements of the billions of nanoelectronic components inside integrated circuits (ICs) …

[图书][B] Electrical Atomic Force Microscopy for Nanoelectronics

U Celano - 2019 - books.google.com
The tremendous impact of electronic devices on our lives is the result of continuous
improvements of the billions of nanoelectronic components inside integrated circuits (ICs) …

[引用][C] Electrical Atomic Force Microscopy for Nanoelectronics

U Celano - NanoScience and Technology, 2019 - cir.nii.ac.jp

[引用][C] Electrical atomic force microscopy for nanoelectronics

U Celano - (No Title) - cir.nii.ac.jp
Electrical atomic force microscopy for nanoelectronics | CiNii Research CiNii 国立情報学研究所
学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データをさがす 大学 …

The Atomic Force Microscopy for Nanoelectronics

U Celano - Electrical Atomic Force Microscopy for …, 2019 - books.google.com
The invention of scanning tunneling microscopy (STM), rapidly followed by atomic force
microscopy (AFM), occurred at the time when extensive research on sub-μm metal oxide …

[引用][C] Electrical Atomic Force Microscopy for Nanoelectronics

U Celano - 2019 - imec-publications.be
Electrical Atomic Force Microscopy for Nanoelectronics Toggle navigation My submissions Login
Toggle navigation View item imec Publications Repository imec Publications Books View item …