Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales

M Ebrahimi, A Evans, MB Tahoori… - … , Automation & Test …, 2014 - ieeexplore.ieee.org
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …
被引用次数：61 相关文章

Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales

M Ebrahimi, A Evans, MB Tahoori… - Design, Automation & …, 2014 - hal.univ-smb.fr
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …

Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales

M Ebrahimi, A Evans, MB Tahoori, R Seyyedi… - Proceedings of the …, 2014 - dl.acm.org
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …

[引用][C] Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales

M Ebrahimi, A Evans, MB Tahoori, R Seyyedi… - Design, Automation & …, 2014 - cir.nii.ac.jp
Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded
processor at nanoscales | CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] …

Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales

M Ebrahimi, A Evans, MB Tahoori, R Seyyedi… - Design, Automation & …, 2014 - hal.science
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …

Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales

M Ebrahimi, A Evans, MB Tahoori, R Seyyedi… - 2014 Design, Automation … - infona.pl
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …
[PDF] date-conference.com

[PDF][PDF] Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales

M Ebrahimi, A Evans, MB Tahoori, R Seyyedi… - date-conference.com
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …
[PDF] date-conference.com

[PDF][PDF] Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales

M Ebrahimi, A Evans, MB Tahoori, R Seyyedi… - past.date-conference.com
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …
[PDF] psu.edu

[PDF][PDF] Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales

M Ebrahimi, A Evans, MB Tahoori, R Seyyedi… - Citeseer
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …

Comprehensive Analysis of Alpha and Neutron Particle-induced Soft Errors in an Embedded Processor at Nanoscales

M Ebrahimi, A Evans, MB Tahoori… - Design, Automation & …, 2014 - hal.univ-smb.fr
Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …