Electrical measurement techniques in atomic force microscopy

A Avila, B Bhushan - Critical Reviews in Solid State and Materials …, 2010 - Taylor & Francis
A conductive tip in an atomic force microscope (AFM) has extended the capability from
conventional topographic imaging to electrical surface characterization. The conductive tip …
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[引用][C] Electrical Measurement Techniques in Atomic Force Microscopy

A Avila, B Bhushan - Critical Reviews in Solid State & …, 2010 - ui.adsabs.harvard.edu
Electrical Measurement Techniques in Atomic Force Microscopy - NASA/ADS Now on home
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[PDF] academia.edu

[PDF][PDF] Electrical Measurement Techniques in Atomic Force Microscopy

A Avila, B Bhushan - Critical Reviews in Solid State and Materials …, 2010 - academia.edu
A conductive tip in an atomic force microscope (AFM) has extended the capability from
conventional topographic imaging to electrical surface characterization. The conductive tip …

[引用][C] Electrical Measurement Techniques in Atomic Force Microscopy

A AVILA, B BHUSHAN - Critical reviews in solid state and …, 2010 - Taylor & Francis