Neural network based technique for detecting catastrophic and parametric faults in analog circuits

18th International Conference on Systems Engineering …, 2005 - ieeexplore.ieee.org
The approach to transient functional test of analog circuits is considered. The artificial neural
network is proposed for realization of the circuit under test (CUT) response analysis. The …
被引用次数：19 相关文章

[引用][C] Neural network-based technique for detecting catastrophic and parametric faults in analog circuits

SG Mosin - … 18th International Conference on Systems Engineering …, 2005 - elibrary.ru
Neural network-based technique for detecting catastrophic and parametric faults in analog
circuits КОРЗИНА ПОИСК НАВИГАТОР ЖУРНАЛЫ КНИГИ ПАТЕНТЫ ПОИСК АВТОРЫ …

Neural Network-Based Technique for Detecting Catastrophic and Parametric Faults in Analog Circuits

SG Mosin - Proceedings of the 18th International Conference on …, 2005 - dl.acm.org
The approach to transient functional test of analog circuits is considered. The artificial neural
network is proposed for realization of the circuit under test (CUT) response analysis. The …