[图书][B] Error characterization, channel modeling and coding for flash memories
V Taranalli - 2017 - search.proquest.com
NAND Flash memories have become a widely used non-volatile data storage technology
and their application areas are expected to grow in the future with the advent of cloud …
and their application areas are expected to grow in the future with the advent of cloud …
Error Characterization, Channel Modeling and Coding for Flash Memories
V Taranalli - 2017 - escholarship.org
NAND Flash memories have become a widely used non-volatile data storage technology
and their application areas are expected to grow in the future with the advent of cloud …
and their application areas are expected to grow in the future with the advent of cloud …