Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV Kalinin, DA Bonnell, M Freitag… - Applied physics letters, 2002 - pubs.aip.org
Scanning surface potential microscopy (SSPM) is one of the most widely used techniques
for the characterization of electrical properties at small dimensions. Applicability of SSPM …
被引用次数：40 相关文章

Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV Kalinin, DA Bonnell, M Freitag… - Applied Physics …, 2002 - ui.adsabs.harvard.edu
Scanning surface potential microscopy (SSPM) is one of the most widely used techniques
for the characterization of electrical properties at small dimensions. Applicability of SSPM …

Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

V Vac - APPLIED PHYSICS LETTERS, 2002 - pubs.aip.org
Scanning surface potential microscopy SSPM is one of the most widely used techniques for
the characterization of electrical properties at small dimensions. Applicability of SSPM and …
[PDF] researchgate.net

[PDF][PDF] Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV Kalinin, M Freitag, AT Johnson, DA Bonnell - researchgate.net
ABSTRACT Scanning Surface Potential Microscopy (SSPM) is one of the most widely used
techniques for the characterization of electrical properties at small dimensions. Applicability …
[PDF] archive.org

[PDF][PDF] Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

V Vac - APPLIED PHYSICS LETTERS, 2002 - scholar.archive.org
Scanning surface potential microscopy SSPM is one of the most widely used techniques for
the characterization of electrical properties at small dimensions. Applicability of SSPM and …

Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV Kalinin, DA Bonnell, M Freitag, AT Johnson - Applied Physics Letters, 2002 - osti.gov
Scanning surface potential microscopy (SSPM) is one of the most widely used techniques
for the characterization of electrical properties at small dimensions. Applicability of SSPM …

[引用][C] Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV Kalinin, DA Bonnell, M Freitag, AT Johnson - Applied Physics Letters, 2002 - elibrary.ru
Carbon nanotubes as a tip calibration standard for electrostatic scanning probe
microscopies КОРЗИНА ПОИСК НАВИГАТОР ЖУРНАЛЫ КНИГИ ПАТЕНТЫ ПОИСК …

Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV Kalinin, DA Bonnell, M Freitag… - Applied Physics …, 2002 - inis.iaea.org
[en] Scanning surface potential microscopy (SSPM) is one of the most widely used
techniques for the characterization of electrical properties at small dimensions. Applicability …

Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV Kalinin, M Freitag, AT Johnson… - arXiv preprint cond-mat …, 2002 - arxiv.org
Scanning Surface Potential Microscopy (SSPM) is one of the most widely used techniques
for the characterization of electrical properties at small dimensions. Applicability of SSPM …

[引用][C] Carbon nanotubes as a tip calibration standard for electrostatic scanning probe microscopies

SV KALININ, DA BONNELL… - Applied …, 2002 - American Institute of Physics