Survey of low power testing of VLSI circuits
P Basker, A Arulmurugan - 2012 International Conference on …, 2012 - ieeexplore.ieee.org
The System-On-Chip (SoC) revolution challenges both design and test engineers,
especially in the area of power dissipation. Generally, a circuit or system consumes more …
especially in the area of power dissipation. Generally, a circuit or system consumes more …
Survey of Low Power Testing of VLSI Circuits
P Basker, A Arulmurugan - Science Journal of Circuits, Systems and …, 2013 - radscit.org
Abstract The System-On-Chip (SoC) revolution challenges both design and test engineers,
especially in the area of power dissipation. Generally, a circuit or system consumes more …
especially in the area of power dissipation. Generally, a circuit or system consumes more …
Survey of low power testing of VLSI circuits
P Basker, A Arulmurugan - 2012 International Conference on Computer … - infona.pl
The System-On-Chip (SoC) revolution challenges both design and test engineers,
especially in the area of power dissipation. Generally, a circuit or system consumes more …
especially in the area of power dissipation. Generally, a circuit or system consumes more …
[PDF][PDF] Survey of low power testing of VLSI circuits
P Basker, A Arulmurugan - Citeseer
The System-On-Chip (SoC) revolution challenges both design and test engineers,
especially in the area of power dissipation. Generally, a circuit or system consumes more …
especially in the area of power dissipation. Generally, a circuit or system consumes more …