A Low Power Scan Design Architecture

HB Min, IS Kim - The Transactions of the Korean Institute of …, 2005 - koreascience.kr
Power dissipated during test application is substantially higher than power dissipated during
functional operation which can decrease the reliability and lead to yield loss. This paper …
被引用次数：2 相关文章

[引用][C] A Low Power Scan Design Architecture

I Kim, S Park, HB Min - 대한전자공학회ISOCC, 2004 - dbpia.co.kr
Power dissipated during test application is substantially higher than pover dissipated during
functional operation which can decrease the reliability and lead to yield loss. This paper …