Structural and electrical properties of Ni∕ Ti Schottky contacts on silicon carbide upon thermal annealing

F Roccaforte, F La Via, A Baeri, V Raineri… - Journal of applied …, 2004 - pubs.aip.org
The evolution of the structural and electrical properties of Ni/Ti/SiC Schottky contacts upon
thermal treatments was investigated. The samples were prepared by sequentially …
被引用次数：77 相关文章

Structural and electrical properties of Ni/Ti Schottky contacts on silicon carbide upon thermal annealing

F Roccaforte, F La Via, A Baeri… - Journal of Applied …, 2004 - ui.adsabs.harvard.edu
The evolution of the structural and electrical properties of Ni/Ti/SiC Schottky contacts upon
thermal treatments was investigated. The samples were prepared by sequentially …

Structural and electrical properties of Schottky contacts on silicon carbide upon thermal annealing

F Roccaforte, F La Via, A Baeri, V Raineri… - Journal of Applied …, 2004 - pubs.aip.org
The evolution of the structural and electrical properties of Ni∕ Ti∕ Si C Schottky contacts
upon thermal treatments was investigated. The samples were prepared by sequentially …
[PDF] unict.it

[PDF][PDF] Structural and electrical properties of Ni/Ti Schottky contacts on silicon carbide upon thermal annealing

F Roccaforte, F La Via, A Baeri, V Raineri… - JOURNAL OF APPLIED …, 2004 - iris.unict.it
The evolution of the structural and electrical properties of Ni/Ti/SiC Schottky contacts upon
thermal treatments was investigated. The samples were prepared by sequentially …
[PDF] unict.it

[PDF][PDF] Structural and electrical properties of Ni/Ti Schottky contacts on silicon carbide upon thermal annealing

F Roccaforte, F La Via, A Baeri, V Raineri… - JOURNAL OF APPLIED …, 2004 - iris.unict.it
The evolution of the structural and electrical properties of Ni/Ti/SiC Schottky contacts upon
thermal treatments was investigated. The samples were prepared by sequentially …

[引用][C] Structural and electrical properties of Ni

F ROCCAFORTE, F LA VIA… - Journal of …, 2004 - American Institute of Physics