Extend orthogonal Latin square codes for 32-bit data protection in memory applications
S Liu, L Xiao, Z Mao - Microelectronics Reliability, 2016 - Elsevier
As CMOS technology size scales down, multiple cell upsets (MCUs) caused by a single
radiation particle have become one of the most challenging reliability issues for memories …
radiation particle have become one of the most challenging reliability issues for memories …
Extend orthogonal Latin square codes for 32-bit data protection in memory applications
S Liu, L Xiao, Z Mao - Microelectronics Reliability, 2016 - infona.pl
As CMOS technology size scales down, multiple cell upsets (MCUs) caused by a single
radiation particle have become one of the most challenging reliability issues for memories …
radiation particle have become one of the most challenging reliability issues for memories …
Extend orthogonal Latin square codes for 32-bit data protection in memory applications
S Liu, L Xiao, Z Mao - Microelectronics reliability, 2016 - dialnet.unirioja.es
As CMOS technology size scales down, multiple cell upsets (MCUs) caused by a single
radiation particle have become one of the most challenging reliability issues for memories …
radiation particle have become one of the most challenging reliability issues for memories …
Extend orthogonal Latin square codes for 32-bit data protection in memory applications
S Liu, L Xiao, Z Mao - Microelectronics Reliability, 2016 - ui.adsabs.harvard.edu
As CMOS technology size scales down, multiple cell upsets (MCUs) caused by a single
radiation particle have become one of the most challenging reliability issues for memories …
radiation particle have become one of the most challenging reliability issues for memories …