Scanning probe microscopy for testing ultrafast electronic devices

AS Hou, BA Nechay, F Ho, DM Bloom - Optical and quantum electronics, 1996 - Springer
Scanning force microscopy has been developed as a practical, non-contact probing
technique for measuring voltage waveforms at internal nodes of integrated devices and …
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[引用][C] Scanning probe microscopy for testing ultrafast electronic devices

AS HOU, BA NECHAY, F HO… - Optical and quantum …, 1996 - pascal-francis.inist.fr
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[引用][C] Scanning probe microscopy for testing ultrafast electronic devices

AS Hou, BA Nechay, F Ho, DM Bloom - Optical and Quantum Electronics, 1996 - cir.nii.ac.jp
Scanning probe microscopy for testing ultrafast electronic devices | CiNii Research CiNii 国立
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[引用][C] Scanning probe microscopy for testing ultrafast electronic devices

AS Hou, BA Nechay, F Ho, DM Bloom - Optical and Quantum Electronics, 1996 - Springer