Hardened design based on advanced orthogonal Latin code against two adjacent multiple bit upsets (MBUs) in memories
L Xiao, J Li, J Li, J Guo - Sixteenth international symposium on …, 2015 - ieeexplore.ieee.org
Soft errors have been a concern in memory reliability for many years. With device feature
size decreasing and memories density increasing, a single event upset (SEU) in memory …
size decreasing and memories density increasing, a single event upset (SEU) in memory …
[PDF][PDF] Hardened Design Based on Advanced Orthogonal Latin Code against Two Adjacent Multiple Bit Upsets (MBUs) in Memories
L Xiao, J Li, J Li, J Guo - researchgate.net
Soft errors have been a concern in memory reliability for many years. With device feature
size decreasing and memories density increasing, a single event upset (SEU) in memory …
size decreasing and memories density increasing, a single event upset (SEU) in memory …
Hardened design based on advanced orthogonal Latin code against two adjacent multiple bit upsets (MBUs) in memories
L Xiao, J Li, J Li, J Guo - … International Symposium on Quality Electronic Design - infona.pl
Soft errors have been a concern in memory reliability for many years. With device feature
size decreasing and memories density increasing, a single event upset (SEU) in memory …
size decreasing and memories density increasing, a single event upset (SEU) in memory …