Syra: Early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems

IEEE Transactions on Computers, 2018 - ieeexplore.ieee.org
Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
design of a microprocessor-based system. Nevertheless, deciding how to distribute the error …
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SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

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Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
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SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

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Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
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SyRA: Early System Reliability Analysis for Cross-Layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

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Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
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[PDF] core.ac.uk

[PDF][PDF] SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems

A Vallero, A Savino, A Chatzidimitriou, M Kaliorakis… - core.ac.uk
Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
design of a microprocessor-based system. Nevertheless, deciding how to distribute the error …

SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems

A Vallero, A Savino, A Chatzidimitriou… - IEEE transactions …, 2018 - upcommons.upc.edu
Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
design of a microprocessor-based system. Nevertheless, deciding how to distribute the error …