A light-weight defect detection model for capacitor appearance based on the Yolov5

L Xu, X Xu, Q Xia, Y Yao, Z Jiang - Measurement, 2024 - Elsevier
As one of the most important electronic components, capacitors are very important for
appearance inspection in the production process. However, the current production process …

A light-weight defect detection model for capacitor appearance based on the Yolov5

L Xu, X Xu, Q Xia, Y Yao, Z Jiang - Measurement, 2024 - ui.adsabs.harvard.edu
Proposed a capacitor appearance inspection method based on YOLOv5. Compressing
network models at the backbone and neck to reduce computational costs. Using the …