Knowledge discovery and knowledge transfer in board-level functional fault diagnosis

F Ye, Z Zhang, K Chakrabarty… - 2014 International Test …, 2014 - ieeexplore.ieee.org
Diagnosis of functional failures at the board level is critical for improving product yield and
reducing manufacturing cost. Reasoning techniques increase the accuracy of functional …
被引用次数：21 相关文章

Knowledge discovery and knowledge transfer in board-level functional fault diagnosis

F Ye, Z Zhang, K Chakrabarty, X Gu - 2014 IEEE International Test …, 2014 - computer.org
Diagnosis of functional failures at the board level is critical for improving product yield and
reducing manufacturing cost. Reasoning techniques increase the accuracy of functional …

Knowledge discovery and knowledge transfer in board-level functional fault diagnosis

F Ye, Z Zhang, K Chakrabarty, X Gu - 2014 International Test Conference - infona.pl
Diagnosis of functional failures at the board level is critical for improving product yield and
reducing manufacturing cost. Reasoning techniques increase the accuracy of functional …