OM Alatise, KSK Kwa, SH Olsen, AG O'Neill - 2010 - core.ac.uk
The impact of the SiGe strain relaxed buffer (SRB) thickness on the analog performance of strained Si nMOSFETs is investigated. The negative drain conductance caused by self …
OM Alatise, KSK Kwa, SH Olsen, AG O'Neill - 2010 - Citeseer
The impact of the SiGe strain relaxed buffer (SRB) thickness on the analog performance of strained Si nMOSFETs is investigated. The negative drain conductance caused by self …
OM Alatise, KSK Kwa, SH Olsen, AG O'Neill - Solid-State Electronics, 2010 - hero.epa.gov
The impact of the thickness of the silicon-germanium strain-relaxed buffer (SiGe SRB) on the analog performance of strained Si nMOSFETs is investigated. The negative drain …
OM Alatise, KSK Kwa, SH Olsen, AG O'Neill - Solid State Electronics, 2010 - infona.pl
The impact of the thickness of the silicon–germanium strain-relaxed buffer (SiGe SRB) on the analog performance of strained Si nMOSFETs is investigated. The negative drain …
OM Alatise, KSK Kwa, SH Olsen… - Solid-State …, 2010 - wrap.warwick.ac.uk
The impact of the thickness of the silicon–germanium strain-relaxed buffer (SiGe SRB) on the analog performance of strained Si nMOSFETs is investigated. The negative drain …
OM ALATISE, KSK KWA, SH OLSEN… - Solid-state …, 2010 - pascal-francis.inist.fr
The impact of self-heating and SiGe strain-relaxed buffer thickness on the analog performance of strained Si nMOSFETs CNRS Inist Pascal-Francis CNRS Pascal and …
OM Alatise, KSK Kwa, SH Olsen… - Solid State …, 2010 - ui.adsabs.harvard.edu
The impact of the thickness of the silicon-germanium strain-relaxed buffer (SiGe SRB) on the analog performance of strained Si nMOSFETs is investigated. The negative drain …
OM Alatise, KSK Kwa, SH Olsen… - Solid-State Electronics, 2010 - eprints.ncl.ac.uk
The impact of the thickness of the silicon-germanium strain-relaxed buffer (SiGe SRB) on the analog performance of strained Si nMOSFETs is investigated. The negative drain …
OM Alatise, KSK Kwa, SH Olsen, AG O'Neill - 2010 - wrap.warwick.ac.uk
The impact of the SiGe strain relaxed buffer (SRB) thickness on the analog performance of strained Si nMOSFETs is investigated. The negative drain conductance caused by self …