Profiling defect depth in composite materials using thermal imaging NDE

O Obeidat, Q Yu, X Han - AIP Conference Proceedings, 2018 - pubs.aip.org
ABSTRACT Sonic Infrared (IR) NDE, is a relatively new NDE technology; it has been
demonstrated as a reliable and sensitive method to detect defects. SIR uses ultrasonic …
被引用次数：2 相关文章

Profiling defect depth in composite materials using thermal imaging NDE

O Obeidat, Q Yu, X Han - 44th Annual Review of Progress in …, 2018 - ui.adsabs.harvard.edu
Abstract Sonic Infrared (IR) NDE, is a relatively new NDE technology; it has been
demonstrated as a reliable and sensitive method to detect defects. SIR uses ultrasonic …

Profiling defect depth in composite materials using thermal imaging NDE

O Obeidat, Q Yu, X Han - AIP Conference Proceedings, 2018 - pubs.aip.org
Sonic Infrared (IR) NDE, is a relatively new NDE technology; it has been demonstrated as a
reliable and sensitive method to detect defects. SIR uses ultrasonic excitation with IR …