X-ray microtomography
EN Landis, DT Keane - Materials characterization, 2010 - Elsevier
In this tutorial, we describe X-ray microtomography as a technique to nondestructively
characterize material microstructure in three dimensions at a micron level spatial resolution …
characterize material microstructure in three dimensions at a micron level spatial resolution …
X-ray microtomography
EN Landis, DT Keane - Materials Characterization, 2010 - infona.pl
In this tutorial, we describe X-ray microtomography as a technique to nondestructively
characterize material microstructure in three dimensions at a micron level spatial resolution …
characterize material microstructure in three dimensions at a micron level spatial resolution …
[引用][C] X-ray microtomography
EN LANDIS, DT KEANE - Materials characterization, 2010 - pascal-francis.inist.fr
X-ray microtomography CNRS Inist Pascal-Francis CNRS Pascal and Francis Bibliographic
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Databases Simple search Advanced search Search by classification Search by vocabulary …
X-ray microtomography
EN Landis, DT Keane - Materials Characterization, 2010 - scholars.northwestern.edu
In this tutorial, we describe X-ray microtomography as a technique to nondestructively
characterize material microstructure in three dimensions at a micron level spatial resolution …
characterize material microstructure in three dimensions at a micron level spatial resolution …
X-ray microtomography
EN Landis, DT Keane - Materials Characterization, 2010 - osti.gov
In this tutorial, we describe X-ray microtomography as a technique to nondestructively
characterize material microstructure in three dimensions at a micron level spatial resolution …
characterize material microstructure in three dimensions at a micron level spatial resolution …
X-ray microtomography
EN Landis, DT Keane - Materials Characterization, 2010 - inis.iaea.org
[en] In this tutorial, we describe X-ray microtomography as a technique to nondestructively
characterize material microstructure in three dimensions at a micron level spatial resolution …
characterize material microstructure in three dimensions at a micron level spatial resolution …