Self-validating structured light depth sensor system
IV Brailovskiy, AK Agrawal - US Patent 10,282,857, 2019 - Google Patents
Devices and techniques are described for validation of depth data. A first pattern and second
pattern may be projected. A first image of the first pattern and a second image of the second …
pattern may be projected. A first image of the first pattern and a second image of the second …
Self-validating structured light depth sensor system
IV Brailovskiy, AK Agrawal - US Patent 10,282,857, 2019 - freepatentsonline.com
Devices and techniques are described for validation of depth data. A first pattern and second
pattern may be projected. A first image of the first pattern and a second image of the second …
pattern may be projected. A first image of the first pattern and a second image of the second …