Test power aware STUMP BIST

MR Gowthami, NR Kiran, G Harish… - … Conference on Smart …, 2015 - ieeexplore.ieee.org
The testing power is the biggest concern in modern VLSI chip testing which affects the
reliability of the chip. The testing power is very greater than the functional power because …
被引用次数：6 相关文章

Test power aware STUMP BIST

MR Gowthami, NR Kiran, G Harish, S Yellampalli - … International Conference on … - infona.pl
The testing power is the biggest concern in modern VLSI chip testing which affects the
reliability of the chip. The testing power is very greater than the functional power because …

Test power aware STUMP BIST

MR Gowthami, NR Kiran, G Harish… - … Conference on Smart …, 2015 - computer.org
The testing power is the biggest concern in modern VLSI chip testing which affects the
reliability of the chip. The testing power is very greater than the functional power because …