The emergence of multifrequency force microscopy
R Garcia, ET Herruzo - Nature nanotechnology, 2012 - nature.com
In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …
surface of a sample, and information about the surface is extracted by measuring how the …
The emergence of multifrequency force microscopy.
R Garcia, ET Herruzo - Nature Nanotechnology, 2012 - search.ebscohost.com
In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …
surface of a sample, and information about the surface is extracted by measuring how the …
The emergence of multifrequency force microscopy
R Garcia, ET Herruzo - Nature Nanotechnology, 2012 - ui.adsabs.harvard.edu
In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …
surface of a sample, and information about the surface is extracted by measuring how the …
[引用][C] The emergence of multifrequency force microscopy
R Garcia, ET Herruzo - Nature Nanotechnology, 2012 - cir.nii.ac.jp
[PDF][PDF] The emergence of multifrequency force microscopy
R Garcia, ET Herruzo - core.ac.uk
Atomic force microscopy uses the deflection of a cantilever with a sharp tip to examine
surfaces, and conventional dynamic force microscopy involves the excitation and detection …
surfaces, and conventional dynamic force microscopy involves the excitation and detection …
The emergence of multifrequency force microscopy.
R Garcia, ET Herruzo - Nature Nanotechnology, 2012 - europepmc.org
In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …
surface of a sample, and information about the surface is extracted by measuring how the …
The emergence of multifrequency force microscopy
R Garcia, ET Herruzo - Nature nanotechnology, 2012 - pubmed.ncbi.nlm.nih.gov
In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …
surface of a sample, and information about the surface is extracted by measuring how the …
[PDF][PDF] The emergence of multifrequency force microscopy
R Garcia, ET Herruzo - academia.edu
Atomic force microscopy uses the deflection of a cantilever with a sharp tip to examine
surfaces, and conventional dynamic force microscopy involves the excitation and detection …
surfaces, and conventional dynamic force microscopy involves the excitation and detection …
[PDF][PDF] The emergence of multifrequency force microscopy
R Garcia, ET Herruzo - academia.edu
Atomic force microscopy uses the deflection of a cantilever with a sharp tip to examine
surfaces, and conventional dynamic force microscopy involves the excitation and detection …
surfaces, and conventional dynamic force microscopy involves the excitation and detection …
The emergence of multifrequency force microscopy.
R Garcia, ET Herruzo - Nature Nanotechnology, 2012 - search.ebscohost.com
In atomic force microscopy a cantilever with a sharp tip attached to it is scanned over the
surface of a sample, and information about the surface is extracted by measuring how the …
surface of a sample, and information about the surface is extracted by measuring how the …