Error characterization, mitigation, and recovery in flash-memory-based solid-state drives

Y Cai, S Ghose, EF Haratsch, Y Luo… - Proceedings of the …, 2017 - ieeexplore.ieee.org
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …
被引用次数：403 相关文章

Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

Y Cai, S Ghose, EF Haratsch, Y Luo… - Proceedings of the …, 2017 - experts.illinois.edu
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …
[PDF] cmu.edu

[PDF][PDF] Error Characterization, Mitigation, and Recovery in Flash Memory Based Solid-State Drives

Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu - research.ece.cmu.edu
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …

Error Characterization, Mitigation, and Recovery in Flash Memory Based Solid-State Drives

Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu - arXiv e-prints, 2017 - ui.adsabs.harvard.edu
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …
[PDF] ieee.org

[PDF][PDF] Error Characterization, Mitigation, and Recovery in Flash Memory Based Solid State Drives

Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu - ieeexplore.ieee.org
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …
[PDF] cmu.edu

[PDF][PDF] Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

Y CAi - Proceedings of the IEEE, 2017 - pdl.cmu.edu
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …

[引用][C] Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu - Proceedings of the IEEE, 2017 - cir.nii.ac.jp
Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives |
CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ …

Error Characterization, Mitigation, and Recovery in Flash Memory Based Solid-State Drives

Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu - borecraft.com
Yu Cai , Saugata Ghose , Erich F. Haratsch , Yixin Luo , Onur Mutlu Page 1 Error
Characterization, Mitigation, and Recovery in Flash Memory Based Solid-State Drives Yu Cai 1 …
[PDF] researchgate.net

[PDF][PDF] Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu - researchgate.net
ABSTRACT NAND flash memory is ubiquitous in everyday life today because its capacity
has continuously increased and cost has continuously decreased over decades. This …
[PDF] cmu.edu

[PDF][PDF] Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

Y CAi - Proceedings of the IEEE, 2017 - cs.cmu.edu
NAND flash memory is ubiquitous in everyday life today because its capacity has
continuously increased and cost has continuously decreased over decades. This positive …