A new BIST structure for low power testing

LJL Jie, YJY Jun, LRL Rui… - 2003 5th International …, 2003 - ieeexplore.ieee.org
A new simple built-in-self-test (BIST) structure for low power testing is presented in this
paper. The principle of the proposed method is to reconstruct the LFSR circuit to reduce the …
被引用次数：17 相关文章

A New BIST Structure For Low Power Testing

LJYJL Rui, W Chao - ieeexplore.ieee.org
A new simple built-in self-test (BIST) structure for low power testing is presented in this
paper. The principle of the proposed method is to reconstmct the LFSR circuit to reduce the …

[引用][C] A new BIST structure for low power testing

L JIE - Proc. International ASIC/SOC Conference, 2003, 2003 - cir.nii.ac.jp